Pulse height analysis using Si-pin diode of x-ray irradiated from a 2.45 GHz electron cyclotron resonance multicharged ion source
作者:
Yushi Kato,
Yoshiyuki Kubo,
Shigeyuki Ishii,
期刊:
Review of Scientific Instruments
(AIP Available online 1998)
卷期:
Volume 69,
issue 2
页码: 1179-1181
ISSN:0034-6748
年代: 1998
DOI:10.1063/1.1148659
出版商: AIP
数据来源: AIP
摘要:
Production of multicharged ions is experimentally studied on an electron cyclotron resonance (ECR) source. The ECR zone for a microwave frequency of 2.45 GHz is formed at the bottom of a mirror trap. The x-ray spectra are measured by Si-pin diode detector in the various operating conditions. Available energy range of the x-ray measurement is several keV approximately several tens keV. Measurements are carried out at either line of sight including the ECR zone along the geometrical axis or at off-ECR zone from the side wall. The temperatures determined at both positions are about 2–3 keV from the observed spectrum with assuming nonrelativistic maxwellian plasma. The intensities of ArK&agr;and bremsstrahlung radiation correlate to pressure and microwave power dependence of multicharged-ion production. But the dependence of the temperature is not clear. Therefore the multicharged-ion production largely depends on an abundance of high energy electrons rather than the change of the temperature of them in this energy region; and it is suggested that the emission profiles of the x-ray radiation peaks at the center of the mirror at the low pressure. ©1998 American Institute of Physics.
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