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Infrared and Optical Laser Rectification in STM Junctions

 

作者: Thomas E. Sullivan,   Paul H. Cutler,  

 

期刊: AIP Conference Proceedings  （AIP Available online 1991）
卷期: Volume 241, issue 1  

页码: 111-124

 

ISSN:0094-243X

 

年代: 1991

 

DOI:10.1063/1.41429

 

出版商: AIP

 

数据来源: AIP

 

摘要:

Scanning tunneling microscope (STM) has been used to characterize the rectifying properties of metal nanojunctions. Advances in nanofabrication have made it possible to fabricate solid state nanotunnel junctions similar to point contact and STM junctions. (AIP)

 

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