Piezoelectric tip‐sample distance control for near field optical microscopes
作者:
Khaled Karrai,
Robert D. Grober,
期刊:
Applied Physics Letters
(AIP Available online 1995)
卷期:
Volume 66,
issue 14
页码: 1842-1844
ISSN:0003-6951
年代: 1995
DOI:10.1063/1.113340
出版商: AIP
数据来源: AIP
摘要:
An aluminum coated tapered optical fiber is rigidly attached to one of the prongs of a highQpiezoelectric tuning fork. The fork is mechanically dithered at its resonance frequency (33 kHz) so that the tip amplitude does not exceed 0.4 nm. A corresponding piezoelectric signal is measured on electrodes appropriately placed on the prongs. As the tip approaches within 20 nm above the sample surface a 0.1 nN drag force acting on the tip causes the signal to reduce. This signal is used to position the optical fiber tip to about 0 to 25 nm above the sample. Shear forces resulting from the tip‐sample interaction can be quantitatively deduced. ©1995 American Institute of Physics.
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