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Some Electronic and Chemical Consequences of Non-basal Dislocations in Crystalline Anthracene

 

作者: J.M. Thomas,   J.O. Williams,  

 

期刊: Molecular Crystals  (Taylor Available online 1969)
卷期: Volume 9, issue 1  

页码: 59-79

 

ISSN:0369-1152

 

年代: 1969

 

DOI:10.1080/15421406908082733

 

出版商: Taylor & Francis Group

 

数据来源: Taylor

 

摘要:

Efforts have been made to detect and characterize individual dislocations, small-angle boundaries and extended (nonequilibrium) lattice vacancies, formed by the annihilation of dislocations, in single crystals of anthracene. Only those dislocations emergent at the basal (OOl) faces may be identified using the dislocation-etch-pit technique; but some information regarding dislocations which glide in the basal plane may be deduced from deformation and cleavage studies. Three distinct kinds of experiments have been carried out on a variety of crystals, the dislocation content of which ranges from 102cm−2(for vapor-grown) to 108cm−2(for deformed melt-grown crystals).

 

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