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Computing Average Run Lengths for Exponential CUSUM Schemes

 

作者: GanF. F.,   ChoiK. P.,  

 

期刊: Journal of Quality Technology  （Taylor Available online 1994）
卷期: Volume 26, issue 2  

页码: 134-143

 

ISSN:0022-4065

 

年代: 1994

 

DOI:10.1080/00224065.1994.11979513

 

出版商: Taylor&Francis

 

关键词: Average Run Length;Cumulative Sum Control Charts;Exponential Distribution;Poisson Distribution

 

数据来源: Taylor

 

摘要:

Exponentially distributed observations arise naturally in the context of monitoring the rate of occurrences of events like nonconforming items. Cumulative sum (CUSUM) control charts are known to be very sensitive in detecting small shifts in the mean. A program is presented for computing average run lengths for CUSUM control charts when observations are exponentially distributed.

 

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