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Visualization of thick specimens using a reflection acoustic microscope

 

作者: B. Nongaillard,   J. M. Rouvaen,   E. Bridoux,   R. Torguet,   C. Bruneel,  

 

期刊: Journal of Applied Physics  （AIP Available online 1979）
卷期: Volume 50, issue 3  

页码: 1245-1249

 

ISSN:0021-8979

 

年代: 1979

 

DOI:10.1063/1.326144

 

出版商: AIP

 

数据来源: AIP

 

摘要:

A reflection acoustic microscope may be used to image structural details under the apparent surface of a thick sample. To design such an apparatus, the geometrical parameters of the acoustic lenses must be carefully defined. The acoustic field distribution has been computed in the previous structure for this purpose. Some preliminary experimental results are also reported here.

 

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