Impurity doping properties of hydrofluorinated amorphous silicon produced by intermediate species SiF2
作者:
Hideki Matsumura,
Hisanori Ihara,
Takashi Uesugi,
期刊:
Journal of Applied Physics
(AIP Available online 1985)
卷期:
Volume 57,
issue 12
页码: 5483-5485
ISSN:0021-8979
年代: 1985
DOI:10.1063/1.334825
出版商: AIP
数据来源: AIP
摘要:
Electrical and optical properties of boron‐ or phosphorus‐doped new hydrofluorinated amorphous silicon (a‐Si:F:H) are experimentally studied. This newa‐Si:F:H is produced by using intermediate species SiF2and H2gas mixture instead of using SiH4gas or SiF4and H2gas mixture. It is found that the doping efficiency for boron or phosphorus in thisa‐Si:F:H film is slightly better than that of conventional hydrogenated amorphous silicon (a‐Si:H), and also that the optical band gap of thisa‐Si:F:H hardly changes for the increase of conductivity due to boron doping while that ofa‐Si:H is apparently decreased.
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