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Impurity doping properties of hydrofluorinated amorphous silicon produced by intermediate species SiF2

 

作者: Hideki Matsumura,   Hisanori Ihara,   Takashi Uesugi,  

 

期刊: Journal of Applied Physics  (AIP Available online 1985)
卷期: Volume 57, issue 12  

页码: 5483-5485

 

ISSN:0021-8979

 

年代: 1985

 

DOI:10.1063/1.334825

 

出版商: AIP

 

数据来源: AIP

 

摘要:

Electrical and optical properties of boron‐ or phosphorus‐doped new hydrofluorinated amorphous silicon (a‐Si:F:H) are experimentally studied. This newa‐Si:F:H is produced by using intermediate species SiF2and H2gas mixture instead of using SiH4gas or SiF4and H2gas mixture. It is found that the doping efficiency for boron or phosphorus in thisa‐Si:F:H film is slightly better than that of conventional hydrogenated amorphous silicon (a‐Si:H), and also that the optical band gap of thisa‐Si:F:H hardly changes for the increase of conductivity due to boron doping while that ofa‐Si:H is apparently decreased.

 

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