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Effects of temperature on the ferroelectric properties of PbZr0.53Ti0.53O3-based capacitors prepared by pulsed laser-ablation deposition

 

作者: R. Dat,   O. Auciello,   A.I. Kingon,  

 

期刊: Integrated Ferroelectrics  (Taylor Available online 1995)
卷期: Volume 8, issue 3-4  

页码: 333-338

 

ISSN:1058-4587

 

年代: 1995

 

DOI:10.1080/10584589508219667

 

出版商: Taylor & Francis Group

 

关键词: Ferroelectric memory;lead zirconate titanate;fatigue;imprint;retention

 

数据来源: Taylor

 

摘要:

The effects of elevated temperature on the long and short term ferroelectric properties of La0.5Sr0.5Co3(LSCO)/PbZr0.53Ti0.47O3(PZT)/La0.5Co3(LSCO) heterostructure capacitors are presented in this paper. Capacitors are evaluated in the temperature range of 25°C to 100°C. Polarization values (switched and non-switched), coercive voltages, and PZT resistivity are measured as a function of temperature. Rate of fatigue, tendency to imprint, and retention loss are also investigated in the 25–100°C temperature range. An activation energy for the process responsible for loss of remanent polarization is determined from the fatigue data.

 

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