Effects of temperature on the ferroelectric properties of PbZr0.53Ti0.53O3-based capacitors prepared by pulsed laser-ablation deposition
作者:
R. Dat,
O. Auciello,
A.I. Kingon,
期刊:
Integrated Ferroelectrics
(Taylor Available online 1995)
卷期:
Volume 8,
issue 3-4
页码: 333-338
ISSN:1058-4587
年代: 1995
DOI:10.1080/10584589508219667
出版商: Taylor & Francis Group
关键词: Ferroelectric memory;lead zirconate titanate;fatigue;imprint;retention
数据来源: Taylor
摘要:
The effects of elevated temperature on the long and short term ferroelectric properties of La0.5Sr0.5Co3(LSCO)/PbZr0.53Ti0.47O3(PZT)/La0.5Co3(LSCO) heterostructure capacitors are presented in this paper. Capacitors are evaluated in the temperature range of 25°C to 100°C. Polarization values (switched and non-switched), coercive voltages, and PZT resistivity are measured as a function of temperature. Rate of fatigue, tendency to imprint, and retention loss are also investigated in the 25–100°C temperature range. An activation energy for the process responsible for loss of remanent polarization is determined from the fatigue data.
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