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Nanostructure fabrication using the selective thermal desorption of SiO2induced by electron beams

 

作者: S. Fujita,   S. Maruno,   H. Watanabe,   M. Ichikawa,  

 

期刊: Applied Physics Letters  (AIP Available online 1996)
卷期: Volume 69, issue 5  

页码: 638-640

 

ISSN:0003-6951

 

年代: 1996

 

DOI:10.1063/1.117932

 

出版商: AIP

 

数据来源: AIP

 

摘要:

It has been found that selective thermal desorption of SiO2on Si (111) substrate is induced by electron‐beam irradiation. By using this selective thermal desorption, a nanofabrication technique has been realized by focused electron beams. Open windows of 10 nm width in a SiO2film have been fabricated by this technique. A pattern transfer from the open windows to thin Si films has also been performed by Si growth and subsequent heating. This has produced Si wires of 10 nm width. ©1996 American Institute of Physics.

 

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