Nanostructure fabrication using the selective thermal desorption of SiO2induced by electron beams
作者:
S. Fujita,
S. Maruno,
H. Watanabe,
M. Ichikawa,
期刊:
Applied Physics Letters
(AIP Available online 1996)
卷期:
Volume 69,
issue 5
页码: 638-640
ISSN:0003-6951
年代: 1996
DOI:10.1063/1.117932
出版商: AIP
数据来源: AIP
摘要:
It has been found that selective thermal desorption of SiO2on Si (111) substrate is induced by electron‐beam irradiation. By using this selective thermal desorption, a nanofabrication technique has been realized by focused electron beams. Open windows of 10 nm width in a SiO2film have been fabricated by this technique. A pattern transfer from the open windows to thin Si films has also been performed by Si growth and subsequent heating. This has produced Si wires of 10 nm width. ©1996 American Institute of Physics.
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