首页   按字顺浏览 期刊浏览 卷期浏览 Light Scattering and Electron Microscopic Characterization of Amylose Films
Light Scattering and Electron Microscopic Characterization of Amylose Films

 

作者: J. Borch,   R. Muggli,   A. Sarko,   R. H. Marchessault,  

 

期刊: Journal of Applied Physics  (AIP Available online 1971)
卷期: Volume 42, issue 12  

页码: 4570-4579

 

ISSN:0021-8979

 

年代: 1971

 

DOI:10.1063/1.1659825

 

出版商: AIP

 

数据来源: AIP

 

摘要:

The anisotropic morphology of amylose films is described by solid‐state light‐scattering analysis. A wide range of supermolecular structures was found, varying from ``rodlike'' texture for water‐cast films to ``ringed spherulitic'' texture for those cast from dimethyl sulfoxide (DMSO). After treatments, such as alcohol swelling or prolonged exposure at high relative humidity, the DMSO‐cast films undergo significant textural modification which is best characterized by the observed changes in the scattering envelopes. Electron microscopy is, in general, in accord with these observations, although the advantage of the light‐scattering method over electron and simple polarization microscopy for characterizing such systems is clearly shown.

 

点击下载:  PDF (1004KB)



返 回