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Systems approach to quality control

 

作者: CERRYM. KLEIN,   SENCER YERALAN,  

 

期刊: International Journal of Systems Science  (Taylor Available online 1990)
卷期: Volume 21, issue 12  

页码: 2653-2662

 

ISSN:0020-7721

 

年代: 1990

 

DOI:10.1080/00207729008910578

 

出版商: Taylor & Francis Group

 

数据来源: Taylor

 

摘要:

The quality of a product has become an essential component in today's international market-place. In manufacturing systems operating under a ‘no-defects’ quality-control policy, locating the origin of any imperfections must be implemented by placing several inspection stations within the production process. In this paper an aggregate manufacturing-inspection system model which represents a no-defects control policy is presented. The model can be used to qualitatively predict the effect of inspection on product quality under several different system configurations and hence can be used as a design tool as well as a quality-control tool.

 

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