Formulas are derived for correcting observed x‐ray line profiles for distortion caused by low specimen absorption coefficient in both the asymmetrical Bragg and Laue cases. In the symmetrical Bragg case (incident and reflected x‐ray beams make equal angles with the specimen surface) the present results reduce to those obtained by Keating and Warren. By making suitable approximations, all of the usual intensity formulas for the Bragg and Laue cases are obtained. It is shown that the absorption corrections for the integrated intensity can be obtained directly from measurements of the background radiation.