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Improved time‐of‐flight ion charge state diagnostic

 

作者: I. G. Brown,   J. E. Galvin,   R. A. MacGill,   R. T. Wright,  

 

期刊: Review of Scientific Instruments  （AIP Available online 1987）
卷期: Volume 58, issue 9  

页码: 1589-1592

 

ISSN:0034-6748

 

年代: 1987

 

DOI:10.1063/1.1139405

 

出版商: AIP

 

数据来源: AIP

 

摘要:

A time‐of‐flight diagnostic for analysis of relatively low‐energy ion beams is described. The system incorporates several novel features which improve its performance in a number of ways. The technique is simple and can provide an alternative to magnetic analysis of ion beams for the determination of ion charge state and beam composition.

 

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