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Large second‐order optical nonlinearities in pulsed laser ablated silicon carbide thin films

 

作者: P. M. Lundquist,   H. C. Ong,   W. P. Lin,   R. P. H. Chang,   J. B. Ketterson,   G. K. Wong,  

 

期刊: Applied Physics Letters  （AIP Available online 1995）
卷期: Volume 67, issue 20  

页码: 2919-2921

 

ISSN:0003-6951

 

年代: 1995

 

DOI:10.1063/1.114842

 

出版商: AIP

 

数据来源: AIP

 

摘要:

Large second‐order nonlinear optical response has been observed in silicon carbide thin films deposited by pulsed laser ablation on sapphire and fused silica substrates; films on both substrates were uniform and optically transparent but exhibited distinct orientations. Thed33values of the sapphire‐substrate samples were determined to be 10 pm/V. ©1995 American Institute of Physics.

 

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