Near‐field scanning optical microscopy in reflection: A study of far‐field collection geometry effects
作者:
Kenneth D. Weston,
Jessie A. DeAro,
Steven K. Buratto,
期刊:
Review of Scientific Instruments
(AIP Available online 1996)
卷期:
Volume 67,
issue 8
页码: 2924-2929
ISSN:0034-6748
年代: 1996
DOI:10.1063/1.1147073
出版商: AIP
数据来源: AIP
摘要:
We have designed and demonstrated two simple and versatile reflection mode near‐field scanning optical microscopes (NSOMs). In one scanner far‐field collection is coaxial with the NSOM tip, and in the other scanner, the far‐field collection is at a 45° angle to the NSOM tip. We quantitatively compare images obtained with the two scanners. While off‐axis collection offers a significantly higher signal‐to‐noise ratio, it also introduces tip shadowing in samples with topographic features larger than approximately 40 nm. The additional contrast from the shadowing further complicates image interpretation and must be considered when performing NSOM in reflection with off‐axis collection. In addition, we discuss some general issues that should be considered when designing a reflection NSOM. ©1996 American Institute of Physics.
点击下载:
PDF
(305KB)
返 回