Band‐gap determination by photoreflectance of InGaAs and InAlAs lattice matched to InP
作者:
D. K. Gaskill,
N. Bottka,
L. Aina,
M. Mattingly,
期刊:
Applied Physics Letters
(AIP Available online 1990)
卷期:
Volume 56,
issue 13
页码: 1269-1271
ISSN:0003-6951
年代: 1990
DOI:10.1063/1.102533
出版商: AIP
数据来源: AIP
摘要:
Photoreflectance‐derived band‐gap parameters as a function of temperature for InGaAs and InAlAs lattice matched to InP are reported. The experiment was performed on a set of samples of various compositions (and strains) yielding greater reliability and ensuring self‐consistency. For InGaAs, fits to the Varshni equation gaveE0(T=0 K)=803 meV, &agr;=4.0×10−4eV K−1, and &bgr;=226 K. For InAlAs,E0(T=0 K)=1.541 eV, &agr;=4.7×10−4eV K−1, &bgr;=149 K, and &Dgr;0=338 meV.
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