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Band‐gap determination by photoreflectance of InGaAs and InAlAs lattice matched to InP

 

作者: D. K. Gaskill,   N. Bottka,   L. Aina,   M. Mattingly,  

 

期刊: Applied Physics Letters  (AIP Available online 1990)
卷期: Volume 56, issue 13  

页码: 1269-1271

 

ISSN:0003-6951

 

年代: 1990

 

DOI:10.1063/1.102533

 

出版商: AIP

 

数据来源: AIP

 

摘要:

Photoreflectance‐derived band‐gap parameters as a function of temperature for InGaAs and InAlAs lattice matched to InP are reported. The experiment was performed on a set of samples of various compositions (and strains) yielding greater reliability and ensuring self‐consistency. For InGaAs, fits to the Varshni equation gaveE0(T=0 K)=803 meV, &agr;=4.0×10−4eV K−1, and &bgr;=226 K. For InAlAs,E0(T=0 K)=1.541 eV, &agr;=4.7×10−4eV K−1, &bgr;=149 K, and &Dgr;0=338 meV.

 

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