High resolution threshold and pulsed field ionization photoelectron spectroscopy using multi-bunch synchrotron radiation
作者:
C.-W. Hsu,
M. Evans,
C. Y. Ng,
P. Heimann,
期刊:
Review of Scientific Instruments
(AIP Available online 1997)
卷期:
Volume 68,
issue 4
页码: 1694-1702
ISSN:0034-6748
年代: 1997
DOI:10.1063/1.1147977
出版商: AIP
数据来源: AIP
摘要:
We have demonstrated a resolution of 0.8 meV [full width at half-maximum (FWHM)] for threshold photoelectron measurements using a steradiancy-type zero kinetic energy photoelectron (ZEKE-PE) analyzer and the high resolution monochromatized vacuum ultraviolet (VUV) undulator synchrotron radiation of the chemical dynamics beamline at the advanced light source (ALS). Using this high resolution ZEKE-PE energy analyzer to filter prompt electrons and by employing a proper voltage pulsing scheme adapted to the timing structure of the ALS, we have achieved a resolution of 0.5 meV (FWHM) for pulsed field ionization photoelectron (PFI-PE) measurements with little contamination from prompt photoelectrons produced from direct photoionization and autoionizing processes. The experiment scheme presented here is generally applicable to PFI-PE studies using multi-bunch VUV synchrotron radiation at other synchrotron radiation facilities. ©1997 American Institute of Physics.
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