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High resolution threshold and pulsed field ionization photoelectron spectroscopy using multi-bunch synchrotron radiation

 

作者: C.-W. Hsu,   M. Evans,   C. Y. Ng,   P. Heimann,  

 

期刊: Review of Scientific Instruments  (AIP Available online 1997)
卷期: Volume 68, issue 4  

页码: 1694-1702

 

ISSN:0034-6748

 

年代: 1997

 

DOI:10.1063/1.1147977

 

出版商: AIP

 

数据来源: AIP

 

摘要:

We have demonstrated a resolution of 0.8 meV [full width at half-maximum (FWHM)] for threshold photoelectron measurements using a steradiancy-type zero kinetic energy photoelectron (ZEKE-PE) analyzer and the high resolution monochromatized vacuum ultraviolet (VUV) undulator synchrotron radiation of the chemical dynamics beamline at the advanced light source (ALS). Using this high resolution ZEKE-PE energy analyzer to filter prompt electrons and by employing a proper voltage pulsing scheme adapted to the timing structure of the ALS, we have achieved a resolution of 0.5 meV (FWHM) for pulsed field ionization photoelectron (PFI-PE) measurements with little contamination from prompt photoelectrons produced from direct photoionization and autoionizing processes. The experiment scheme presented here is generally applicable to PFI-PE studies using multi-bunch VUV synchrotron radiation at other synchrotron radiation facilities. ©1997 American Institute of Physics.

 

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