In this article, an analytical model for Type I magnetic contrast enhancement in the scanning electron microscope, achieved by sample tilting, is presented. The model accounts for the energy filtering of the secondary electrons emitted from the sample. The results showed that the optimum sample tilt angle for maximum contrast is a function of the field-distance integral. For small field-distance integrals less than10−7 Tm,corresponding to a weak magnetic field situation, the optimum sample tilt is close to 0°. For large field-distance integrals, the optimum sample tilt angle increases and approaches 45° for a field-distance integral of8×10−6 Tm.©1997 American Institute of Physics.