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High‐Resolution Polarizing Microscope for the Observation of Magnetic Structures at Low Temperatures

 

作者: H. Kirchner,  

 

期刊: Review of Scientific Instruments  (AIP Available online 1973)
卷期: Volume 44, issue 4  

页码: 379-382

 

ISSN:0034-6748

 

年代: 1973

 

DOI:10.1063/1.1686138

 

出版商: AIP

 

数据来源: AIP

 

摘要:

A polarizing microscope is described, in which solid state samples can be cooled down to liquid‐helium temperatures and can be observed with a resolution of the order of 1 &mgr;. By means of this microscope and thin magneto‐optical EuS/EuF2films, the intermediate state in type‐I‐superconducting films of lead and tin could be resolved for the first time.

 

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