Increased critical current density in Nb–Ti wires having Nb artificial pinning centers
作者:
R. W. Heussner,
J. D. Marquardt,
P. J. Lee,
D. C. Larbalestier,
期刊:
Applied Physics Letters
(AIP Available online 1997)
卷期:
Volume 70,
issue 7
页码: 901-903
ISSN:0003-6951
年代: 1997
DOI:10.1063/1.118238
出版商: AIP
数据来源: AIP
摘要:
Artificial pinning center (APC) wires containing Nb 47 wt.&percent; Ti with 24 vol.&percent; of round Nb pins have produced very high critical current densities(Jc)which are attributed to a sharply defined, nanometer-scale Nb-pin array. By reducing both the number of warm extrusion steps from four to three and the temperature of the third extrusion from 650 °C to 250 °C, the degree of pin-matrix interdiffusion has been reduced andJcvalues at all applied magnetic fields increased by 25–45&percent; over those for a previous composite of almost identical design. The best wire achieved the very highJc(5 T, 4.2 K) value of 4600A/mm2. These results underscore the importance of the thermomechanical treatment in determining the maximum flux pinning properties of APC Nb–Ti wires. ©1997 American Institute of Physics.
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