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Ion-implanted MOS technology

 

作者: H.G. Dill,   R.W. Bower,   T.N. Toombs,  

 

期刊: Radiation Effects  (Taylor Available online 1971)
卷期: Volume 7, issue 1-2  

页码: 45-57

 

ISSN:0033-7579

 

年代: 1971

 

DOI:10.1080/00337577108232563

 

出版商: Taylor & Francis Group

 

数据来源: Taylor

 

摘要:

This paper discusses the current state of ion-implantation as applied to MOS technology. It is shown how impurity doping by ion-implantation is used to produce self-aligned MOS gate structures. The reduction in circuit capacitance gives the designer a choice of higher switching speed or lower power dissipation. The availability of a linear resistor of value 1–10 kω/□ allows many new circuit techniques to be applied to monolithic circuits. This paper discusses ion-implantation technology, device design, and circuit performance. A number of implanted circuits are shown. Finally, improvements to the present technology which are still in the R & D phase are described.

 

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