Nanolithography by displacement of catalytic metal clusters using an atomic force microscope tip
作者:
S. L. Brandow,
W. J. Dressick,
C. S. Dulcey,
T. S. Koloski,
L. M. Shirey,
J. Schmidt,
J. M. Calvert,
期刊:
Journal of Vacuum Science&Technology B: Microelectronics and Nanometer Structures Processing, Measurement, and Phenomena
(AIP Available online 1997)
卷期:
Volume 15,
issue 5
页码: 1818-1824
ISSN:1071-1023
年代: 1997
DOI:10.1116/1.589531
出版商: American Vacuum Society
关键词: Pd;Au
数据来源: AIP
摘要:
The use of catalytically active nanoclusters as a novel material for atomic force microscope (AFM) nanolithography is demonstrated. Films were prepared from colloidal Au nanoparticles and giant Pd clusters. Lithographic patterns were generated using the contact area of the AFM tip to physically displace nanoclusters, forming two-dimensional patterns on silicon oxide and functionalized silicon surfaces. Linewidth was found to depend on the force applied to the nanoparticles and the number of tip passes used to generate the pattern. Conditions were optimized to clear scanned areas using minimum applied force. Patterned films were used as templates for the selective deposition of electroless metal, which served as a robust plasma etch mask for pattern transfer into the underlying substrate to a depth of 200 nm. Minimum linewidths of approximately 35 nm were achieved in etched samples.
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