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Semiconducting Films of Antimony

 

作者: Julius Cohen,  

 

期刊: Journal of Applied Physics  (AIP Available online 1954)
卷期: Volume 25, issue 6  

页码: 798-801

 

ISSN:0021-8979

 

年代: 1954

 

DOI:10.1063/1.1721732

 

出版商: AIP

 

数据来源: AIP

 

摘要:

Thin films of antimony were condensed onto substrates at various temperatures. Films deposited at liquid oxygen temperatures showed large negative temperature coefficients of resistance. In general, reversible resistance changes occurred if the films were cooled below a temperature previously reached; irreversible changes took place if the films were heated above that at which they were prepared. Activation energies were calculated from logR vs1/Tcurves and gave values of ∼0.07 ev for low temperatures and ∼0.13 ev for high temperatures. There appeared to be little or no influence of evaporation rate or thickness on the activation energies. A theory based on lattice defects is proposed in order to explain the electrical behavior of the films.

 

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