Study of nonlinear optical effects in GaN:Mg epitaxial film
作者:
H. Y. Zhang,
X. H. He,
Y. H. Shih,
M. Schurman,
Z. C. Feng,
R. A. Stall,
期刊:
Applied Physics Letters
(AIP Available online 1996)
卷期:
Volume 69,
issue 20
页码: 2953-2955
ISSN:0003-6951
年代: 1996
DOI:10.1063/1.117741
出版商: AIP
数据来源: AIP
摘要:
The second‐order nonlinear optical coefficientsd33,d31, andd15of GaN:Mg epitaxial film were studied by the standard Maker fringe of an anisotropic medium. The measuredd33=−(16.5±1.3) pm/V which is 55 times of thed11of quartz. The measured ratios ofd33/d31andd31/d15showed that the crystalline film is close to an ideal wurzite structure. The refractive indices and the dispersive curves ofne,n0were also determined by TM and TE waveguide mode measurements. ©1996 American Institute of Physics.
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