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Study of nonlinear optical effects in GaN:Mg epitaxial film

 

作者: H. Y. Zhang,   X. H. He,   Y. H. Shih,   M. Schurman,   Z. C. Feng,   R. A. Stall,  

 

期刊: Applied Physics Letters  (AIP Available online 1996)
卷期: Volume 69, issue 20  

页码: 2953-2955

 

ISSN:0003-6951

 

年代: 1996

 

DOI:10.1063/1.117741

 

出版商: AIP

 

数据来源: AIP

 

摘要:

The second‐order nonlinear optical coefficientsd33,d31, andd15of GaN:Mg epitaxial film were studied by the standard Maker fringe of an anisotropic medium. The measuredd33=−(16.5±1.3) pm/V which is 55 times of thed11of quartz. The measured ratios ofd33/d31andd31/d15showed that the crystalline film is close to an ideal wurzite structure. The refractive indices and the dispersive curves ofne,n0were also determined by TM and TE waveguide mode measurements. ©1996 American Institute of Physics.

 

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