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Electrostatic Electron Microscopy. III

 

作者: C. H. Bachman,   Simon Ramo,  

 

期刊: Journal of Applied Physics  (AIP Available online 1943)
卷期: Volume 14, issue 4  

页码: 155-160

 

ISSN:0021-8979

 

年代: 1943

 

DOI:10.1063/1.1714968

 

出版商: AIP

 

数据来源: AIP

 

摘要:

This article, the final one of a series on the design of electrostatic electron microscopes, contains a description of an instrument which illustrates the principles previously discussed. The microscope described is believed to be the first constructed with the object of providing the greatest of simplicity in construction, operation, and maintenance with the design parameters balanced to give a particular range of resolving power. The range chosen is about ten times the light microscope. The instrument is permanently aligned and utilizes external photography. The over‐all size and weight of the instrument, as well as the number and complexity of components, are materially less than previously described instruments.

 

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