首页   按字顺浏览 期刊浏览 卷期浏览 Determination of a soft x‐ray spectrum by photoelectron analysis
Determination of a soft x‐ray spectrum by photoelectron analysis

 

作者: P. D. Gupta,   S. K. Goel,   D. D. Bhawalkar,  

 

期刊: Journal of Applied Physics  （AIP Available online 1980）
卷期: Volume 51, issue 4  

页码: 1873-1875

 

ISSN:0021-8979

 

年代: 1980

 

DOI:10.1063/1.327898

 

出版商: AIP

 

数据来源: AIP

 

摘要:

A scheme is proposed and discussed for obtaining soft and ultrasoft x ray spectrums by photoelectron analysis. It is shown that by combining a grating or crystal spectrometer with a photoelectron spectrometer, the x ray spectrum can be obtained unambiguously over a wide range of wavelengths.

 

点击下载:  PDF (224KB)



返 回