Near-field scanning optical microscopy studies ofCu(In,Ga)Se2solar cells
作者:
A. A. McDaniel,
J. W. P. Hsu,
A. M. Gabor,
期刊:
Applied Physics Letters
(AIP Available online 1997)
卷期:
Volume 70,
issue 26
页码: 3555-3557
ISSN:0003-6951
年代: 1997
DOI:10.1063/1.119231
出版商: AIP
数据来源: AIP
摘要:
A near-field scanning optical microscope (NSOM) is used to study the local photoresponse ofCu(In,Ga)Se2thin film solar cells. The grain boundaries of the small grains(<1 &mgr;m)show some reduction in photoresponse; however the photoresponse is significantly reduced near most crevices separating large grains(>10 &mgr;m).In addition, NSOM images show response variations from grain to grain and areas of reduced photoresponse which have no corresponding topography. Photovoltage imaging of the cleaved side of the solar cells reveals the depth and nonuniformities of the actualp-njunction. It is found that the response of thep-njunction varies on a 0.5 &mgr;m length scale. ©1997 American Institute of Physics.
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