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Apparatus for Contactless Measurement of the Photomagnetoelectric Effect

 

作者: Jan Hla´vka,   Ivan Sˇiru˚cˇek,  

 

期刊: Review of Scientific Instruments  （AIP Available online 1973）
卷期: Volume 44, issue 9  

页码: 1410-1411

 

ISSN:0034-6748

 

年代: 1973

 

DOI:10.1063/1.1686403

 

出版商: AIP

 

数据来源: AIP

 

摘要:

The new apparatus for contactless measurement of the photomagnetoelectric (PME) effect is described and its analysis is carried out. By this technique the contactless measurement of lifetime and surface recombination velocity in semiconductors is made possible.

 

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