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DETERMINATION OF INTERNAL STRUCTURE BY ELECTRICAL IMPEDANCE TOMOGRAPHY

 

作者: M. TOFT,   J.C. APPLEBY,  

 

期刊: Nondestructive Testing and Evaluation  （Taylor Available online 1998）
卷期: Volume 14, issue 3  

页码: 173-181

 

ISSN:1058-9759

 

年代: 1998

 

DOI:10.1080/10589759808953049

 

出版商: Taylor & Francis Group

 

关键词: Reduction tomography;Casting;Finite elements;Iteration;Interface parametrisation

 

数据来源: Taylor

 

摘要:

Most tomographic analysis seeks to find the conductivity or another property of a domain, directly or by iteration, assuming nothing a priori about the distribution of internal features. Finite element (FE) analyses therefore require large numbers of variables, each corresponding to The conductivity etc. of one pixel or element. In 3D such analyses produce very large systems of equations

 

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