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Direct imaging of ordered segregation layers in copper doped with bismuth

 

作者: D.E. Luzzi,  

 

期刊: Philosophical Magazine Letters  (Taylor Available online 1991)
卷期: Volume 63, issue 5  

页码: 281-287

 

ISSN:0950-0839

 

年代: 1991

 

DOI:10.1080/09500839108214656

 

出版商: Taylor & Francis Group

 

数据来源: Taylor

 

摘要:

The structure of a faceted ∑ = 3 grain boundary in bismuth-doped copper is analysed using HREM. Experimental image series are compared with calculated image series of model structures of pure copper boundaries and boundaries containing segregated bismuth. A best match is found with a model structure containing an ordered bismuth segregation layer. The results demonstrate the importance of this experimental method for the characterization of complex grain boundary structures using HREM.

 

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