Direct imaging of ordered segregation layers in copper doped with bismuth
作者:
D.E. Luzzi,
期刊:
Philosophical Magazine Letters
(Taylor Available online 1991)
卷期:
Volume 63,
issue 5
页码: 281-287
ISSN:0950-0839
年代: 1991
DOI:10.1080/09500839108214656
出版商: Taylor & Francis Group
数据来源: Taylor
摘要:
The structure of a faceted ∑ = 3 grain boundary in bismuth-doped copper is analysed using HREM. Experimental image series are compared with calculated image series of model structures of pure copper boundaries and boundaries containing segregated bismuth. A best match is found with a model structure containing an ordered bismuth segregation layer. The results demonstrate the importance of this experimental method for the characterization of complex grain boundary structures using HREM.
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