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Temperature dependence of gamma irradiation damage in silicon

 

作者: K.C. Kao,   R.J. Sill,  

 

期刊: Radiation Effects  (Taylor Available online 1972)
卷期: Volume 16, issue 3-4  

页码: 281-286

 

ISSN:0033-7579

 

年代: 1972

 

DOI:10.1080/00337577208231231

 

出版商: Taylor & Francis Group

 

数据来源: Taylor

 

摘要:

The gamma irradiation damage in silicon has been extensively studied by many investigators.(1–6)However, little has been reported about the effects of radiation on the current-voltage (I–V) characteristics of silicon, particularly of high-resistivity silicon at radiation temperatures other than the room temperature. This paper is a report of some new results on the I–V characteristics of low and high resistivity silicon before and after gamma irradiation at the temperature of 38 °C and −196 °C.

 

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