Temperature dependence of gamma irradiation damage in silicon
作者:
K.C. Kao,
R.J. Sill,
期刊:
Radiation Effects
(Taylor Available online 1972)
卷期:
Volume 16,
issue 3-4
页码: 281-286
ISSN:0033-7579
年代: 1972
DOI:10.1080/00337577208231231
出版商: Taylor & Francis Group
数据来源: Taylor
摘要:
The gamma irradiation damage in silicon has been extensively studied by many investigators.(1–6)However, little has been reported about the effects of radiation on the current-voltage (I–V) characteristics of silicon, particularly of high-resistivity silicon at radiation temperatures other than the room temperature. This paper is a report of some new results on the I–V characteristics of low and high resistivity silicon before and after gamma irradiation at the temperature of 38 °C and −196 °C.
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