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Ambipolar diffusion coefficient and carrier lifetime in a compressively strained InGaAsP multiple quantum well device

 

作者: Daniel X. Zhu,   Serge Dubovitsky,   William H. Steier,   Johan Burger,   Denis Tishinin,   Kushant Uppal,   P. Daniel Dapkus,  

 

期刊: Applied Physics Letters  (AIP Available online 1997)
卷期: Volume 71, issue 5  

页码: 647-649

 

ISSN:0003-6951

 

年代: 1997

 

DOI:10.1063/1.119817

 

出版商: AIP

 

数据来源: AIP

 

摘要:

By using the technique of noncollinear nearly-degenerate four-wave mixing, ambipolar diffusion coefficients and carrier lifetimes were directly determined for a compressively-strained InGaAsP multiple quantum well semiconductor optical amplifier operating at 1.3 &mgr;m. A diffusion coefficient of8.0 cm2/sand a carrier lifetime of 1.33 ns, were obtained at the amplifier current density of 1.88kA/cm2.The current-density dependent measurements show that the diffusion coefficient will drop with increasing amplifier pumping current, which is consistent with the prediction of the conventional semiconductor theory. ©1997 American Institute of Physics.

 

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