Ambipolar diffusion coefficient and carrier lifetime in a compressively strained InGaAsP multiple quantum well device
作者:
Daniel X. Zhu,
Serge Dubovitsky,
William H. Steier,
Johan Burger,
Denis Tishinin,
Kushant Uppal,
P. Daniel Dapkus,
期刊:
Applied Physics Letters
(AIP Available online 1997)
卷期:
Volume 71,
issue 5
页码: 647-649
ISSN:0003-6951
年代: 1997
DOI:10.1063/1.119817
出版商: AIP
数据来源: AIP
摘要:
By using the technique of noncollinear nearly-degenerate four-wave mixing, ambipolar diffusion coefficients and carrier lifetimes were directly determined for a compressively-strained InGaAsP multiple quantum well semiconductor optical amplifier operating at 1.3 &mgr;m. A diffusion coefficient of8.0 cm2/sand a carrier lifetime of 1.33 ns, were obtained at the amplifier current density of 1.88kA/cm2.The current-density dependent measurements show that the diffusion coefficient will drop with increasing amplifier pumping current, which is consistent with the prediction of the conventional semiconductor theory. ©1997 American Institute of Physics.
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