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Low temperature and selective growth of &bgr;‐SiC using the SiH2Cl2/i‐C4H10/HCl/H2gas system

 

作者: Yoshio Ohshita,  

 

期刊: Applied Physics Letters  (AIP Available online 1990)
卷期: Volume 57, issue 6  

页码: 605-607

 

ISSN:0003-6951

 

年代: 1990

 

DOI:10.1063/1.103611

 

出版商: AIP

 

数据来源: AIP

 

摘要:

&bgr;‐SiC is grown on a silicon substrate by the chemical vapor deposition method using the SiH2Cl2/i‐C4H10/H2/HCl gas system. Stoichiometric &bgr;‐SiC films are obtained with high growth rate at a low temperature of 900 °C. Highly (111) oriented &bgr;‐SiC polycrystal is grown on a Si(111) substrate. Moreover, using the above‐mentioned gas system, &bgr;‐SiC selective growth is attained on a Si substrate, with no nucleation on the SiO2area. This letter discusses thei‐C4H10effects and selective growth condition.

 

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