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X‐Ray Investigation of Solid Helium

 

作者: S. C. Fain,   D. Lazarus,  

 

期刊: Journal of Applied Physics  （AIP Available online 1970）
卷期: Volume 41, issue 4  

页码: 1451-1454

 

ISSN:0021-8979

 

年代: 1970

 

DOI:10.1063/1.1659055

 

出版商: AIP

 

数据来源: AIP

 

摘要:

Specimens of hcp4He used for thermal conductivity measurements have been examined by an x‐ray method. This method is described and several Laue photographs are shown. These photographs are an excellent test of specimen quality. The number of reflections observed for high‐quality crystals is sufficient for orientation determinations.

 

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