Contrast from Twin Boundaries in Field‐Ion Micrographs
作者:
M. N. Chandrasekharaiah,
S. Ranganathan,
期刊:
Journal of Applied Physics
(AIP Available online 1969)
卷期:
Volume 40,
issue 12
页码: 4835-4836
ISSN:0021-8979
年代: 1969
DOI:10.1063/1.1657298
出版商: AIP
数据来源: AIP
摘要:
Computer simulation and geometrical construction have been used to study the contrast from twin boundaries in field‐ion micrographs. For specific orientations of the twin boundary,mrings of (hkl) planes in the matrix are expected to match withnrings of (h′k′l′) planes in the twin, wheremandnare integers and (hkl) and (h′k′l′) are prominent planes in the matrix and the twin, respectively.
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