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Contrast from Twin Boundaries in Field‐Ion Micrographs

 

作者: M. N. Chandrasekharaiah,   S. Ranganathan,  

 

期刊: Journal of Applied Physics  (AIP Available online 1969)
卷期: Volume 40, issue 12  

页码: 4835-4836

 

ISSN:0021-8979

 

年代: 1969

 

DOI:10.1063/1.1657298

 

出版商: AIP

 

数据来源: AIP

 

摘要:

Computer simulation and geometrical construction have been used to study the contrast from twin boundaries in field‐ion micrographs. For specific orientations of the twin boundary,mrings of (hkl) planes in the matrix are expected to match withnrings of (h′k′l′) planes in the twin, wheremandnare integers and (hkl) and (h′k′l′) are prominent planes in the matrix and the twin, respectively.

 

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