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Scanning force microscopy: Application to nanoscale studies of ferroelectric domains

 

作者: Alexei Gruverman,   Orlando Auciello,   Hiroshi Tokumoto,  

 

期刊: Integrated Ferroelectrics  (Taylor Available online 1998)
卷期: Volume 19, issue 1-4  

页码: 49-83

 

ISSN:1058-4587

 

年代: 1998

 

DOI:10.1080/10584589808012695

 

出版商: Taylor & Francis Group

 

关键词: SFM;ferroelectric domains;thin films piezoelectricity;nanostructures

 

数据来源: Taylor

 

摘要:

Recent advances in nanoscale studies of ferroelectric domains by means of scanning force microscopy (SFM) are reviewed with particular emphasis on investigation of domain structure and polarization reversal in ferroelectric thin films. Applicability of different SFM modes to domain imaging with respect to the physical properties of ferroelectrics is discussed. Examples shown here include results on domain structure observation in single crystals and films by SFM operating in the noncontact, friction, topographic and piezoresponse modes. Domain wall dynamics and fatigue effects as well as SFM spatial resolution of domain structure in thin films are addressed.

 

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