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Polyetherimide (Ultem®) Spin Cast Films by XPS

 

作者: Michael C. Burrell,   John J. Chera,  

 

期刊: Surface Science Spectra  (AIP Available online 1999)
卷期: Volume 6, issue 1  

页码: 18-22

 

ISSN:1055-5269

 

年代: 1999

 

DOI:10.1116/1.1247898

 

出版商: American Vacuum Society

 

关键词: polyetherimide;Ultem;XPS;ESCA

 

数据来源: AIP

 

摘要:

A spin cast film of polyetherimide (Ultem®1000, GE Plastics) was analyzed by XPS using monochromatic AlKαexcitation. The measured atomic composition closely matched the expected stoichiometry of the polymer. Peak positions of the individual chemically shifted C 1s, O 1s, and N 1scomponents are reported. The results are in general agreement with other reported spectra of polyetherimide polymers: experimental, C 83.0%, O 12.9%, and N 4.1%; theoretical, C 82.2%, O 13.3%, and N 4.3%.

 

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