Polyetherimide (Ultem®) Spin Cast Films by XPS
作者:
Michael C. Burrell,
John J. Chera,
期刊:
Surface Science Spectra
(AIP Available online 1999)
卷期:
Volume 6,
issue 1
页码: 18-22
ISSN:1055-5269
年代: 1999
DOI:10.1116/1.1247898
出版商: American Vacuum Society
关键词: polyetherimide;Ultem;XPS;ESCA
数据来源: AIP
摘要:
A spin cast film of polyetherimide (Ultem®1000, GE Plastics) was analyzed by XPS using monochromatic AlKαexcitation. The measured atomic composition closely matched the expected stoichiometry of the polymer. Peak positions of the individual chemically shifted C 1s, O 1s, and N 1scomponents are reported. The results are in general agreement with other reported spectra of polyetherimide polymers: experimental, C 83.0%, O 12.9%, and N 4.1%; theoretical, C 82.2%, O 13.3%, and N 4.3%.
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