PATTERN FORMATION IN SOLID FILM GROWTH DURING CVD
作者:
JACOBJ. THIART,
DARIUSZ ORLICKI,
VLADIMIR HLAVACEK,
期刊:
Chemical Engineering Communications
(Taylor Available online 1996)
卷期:
Volume 152-153,
issue 1
页码: 189-209
ISSN:0098-6445
年代: 1996
DOI:10.1080/00986449608936562
出版商: Taylor & Francis Group
关键词: Pattern formation;CVD;Interface dynamics;Stability analysis;Morphology
数据来源: Taylor
摘要:
This paper deals with the evolution of a gas-solid interface during growth of amorphous CVD films. The aim of the analysis is to show that a comprehensive gas-solid CVD model may simplify significantly under conditions of two limiting cases: kinetic and diffusion-limited growth. The linear stability behavior of the simplified model was found to be almost identical to that of the original and more comprehensive model. It was found that planar film growth was inherently stable under kinetically controlled deposition conditions, but under diffusion-limited conditions, planar film stability depended on the magnitude of the dimensionless group 9Pe, which represents a Damkdhler number of deposition. Numerical solution of the simplified model showed that an increase in 9pe adversely affected the uniformity of film deposition. Predicted morphological phenomena were found to be very similar to experimental observations (Viljoen,et al,1994).
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