Intrinsic electron traps and electronic conduction in YSZ
作者:
R.I. Merino,
V.M. Opera,
期刊:
Radiation Effects and Defects in Solids
(Taylor Available online 1995)
卷期:
Volume 137,
issue 1-4
页码: 273-276
ISSN:1042-0150
年代: 1995
DOI:10.1080/10420159508222734
出版商: Taylor & Francis Group
关键词: Reduced Stabilized-Zirconia;Electronic Conduction;Electron Traps;Impedance Spectroscopy
数据来源: Taylor
摘要:
In the following paper we report the results of a study, by means of impedance spectroscopy, of the conducting properties of thermochemically blackened Yttria Stabilized Zirconia (YSZ) samples, previously investigated by means of optical and paramagnetic resonance spectroscopies. The work focuses on the relation between the characterized electron traps and the semiconducting properties of YSZ. On the light of the results we propose a level diagram for the electrons that accounts for the optical properties of the defects as well as for the electronic conduction of thermochemically reduced samples. This conduction would take place through a band of defects situated about 1.3 eV below the conduction band.
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