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Intrinsic electron traps and electronic conduction in YSZ

 

作者: R.I. Merino,   V.M. Opera,  

 

期刊: Radiation Effects and Defects in Solids  (Taylor Available online 1995)
卷期: Volume 137, issue 1-4  

页码: 273-276

 

ISSN:1042-0150

 

年代: 1995

 

DOI:10.1080/10420159508222734

 

出版商: Taylor & Francis Group

 

关键词: Reduced Stabilized-Zirconia;Electronic Conduction;Electron Traps;Impedance Spectroscopy

 

数据来源: Taylor

 

摘要:

In the following paper we report the results of a study, by means of impedance spectroscopy, of the conducting properties of thermochemically blackened Yttria Stabilized Zirconia (YSZ) samples, previously investigated by means of optical and paramagnetic resonance spectroscopies. The work focuses on the relation between the characterized electron traps and the semiconducting properties of YSZ. On the light of the results we propose a level diagram for the electrons that accounts for the optical properties of the defects as well as for the electronic conduction of thermochemically reduced samples. This conduction would take place through a band of defects situated about 1.3 eV below the conduction band.

 

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