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Discussion

 

作者: JeraldF. Lawless,  

 

期刊: Technometrics  （Taylor Available online 1977）
卷期: Volume 19, issue 4  

页码: 401-404

 

ISSN:0040-1706

 

年代: 1977

 

DOI:10.1080/00401706.1977.10489578

 

出版商: Taylor & Francis Group

 

数据来源: Taylor

 

摘要:

Drs. Meeker and Hahn have presented useful optimum overstress tests, based on the logistic model. This discussion centers on some of the practical problems associated with overstress plans in general, and on the implications of these for optimal experimental design.

 

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