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Temperature‐controlled x‐ray diffraction stage for simultaneous monitoring of structural and dimensional changes, with specimen straining capability

 

作者: Hung C. Ling,   Roy Kaplow,  

 

期刊: Review of Scientific Instruments  (AIP Available online 1980)
卷期: Volume 51, issue 10  

页码: 1335-1337

 

ISSN:0034-6748

 

年代: 1980

 

DOI:10.1063/1.1136058

 

出版商: AIP

 

数据来源: AIP

 

摘要:

An x‐ray diffraction stage has been constructed which allows following structural and precise dimensional changes simultaneously as a function of temperature. It also permits manual (tensile) straining of samples,insitu, at any point in a phase transformation sequence (temperature/phase‐structure) to examine the interplay between stress (or strain), temperature variation and phase transfromation behavior.

 

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