Temperature‐controlled x‐ray diffraction stage for simultaneous monitoring of structural and dimensional changes, with specimen straining capability
作者:
Hung C. Ling,
Roy Kaplow,
期刊:
Review of Scientific Instruments
(AIP Available online 1980)
卷期:
Volume 51,
issue 10
页码: 1335-1337
ISSN:0034-6748
年代: 1980
DOI:10.1063/1.1136058
出版商: AIP
数据来源: AIP
摘要:
An x‐ray diffraction stage has been constructed which allows following structural and precise dimensional changes simultaneously as a function of temperature. It also permits manual (tensile) straining of samples,insitu, at any point in a phase transformation sequence (temperature/phase‐structure) to examine the interplay between stress (or strain), temperature variation and phase transfromation behavior.
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