Electrical resistivity measurements of conductors in the diamond‐window, high‐pressure cell
作者:
H. K. Mao,
P. M. Bell,
期刊:
Review of Scientific Instruments
(AIP Available online 1981)
卷期:
Volume 52,
issue 4
页码: 615-616
ISSN:0034-6748
年代: 1981
DOI:10.1063/1.1136650
出版商: AIP
数据来源: AIP
摘要:
The electrical resistance measurement of metallic conducting materials can be doneinsituin a diamond‐window, high‐pressure cell with a four‐lead arrangement designed to avoid contact and lead‐wire resistances. Variants of the general method include designs for long (several cm) and short (less than 1 mm) length of samples material, and for the use of solid and fluid pressure‐transmitting media.
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