Use of spin‐polarized electron energy‐loss spectroscopy to investigate the probing depth of low energy electrons and the morphology of thin metal films
作者:
X. Zhang,
H. Hsu,
F. B. Dunning,
G. K. Walters,
期刊:
Journal of Vacuum Science&Technology A: Vacuum, Surfaces, and Films
(AIP Available online 1991)
卷期:
Volume 9,
issue 3
页码: 1932-1936
ISSN:0734-2101
年代: 1991
DOI:10.1116/1.577547
出版商: American Vacuum Society
关键词: THIN FILMS;ELECTRON SPECTROSCOPY;MORPHOLOGY;COPPER;MOLYBDENUM;CRYSTAL FACES;IRON;DEPOSITION;PENETRATION DEPTH
数据来源: AIP
摘要:
Spin‐polarized electron energy‐loss spectroscopy has been used to investigate the probing depth of low energy (∼30 eV) electrons at metal surfaces and to study the growth and morphology of monolayer‐level metal films. Studies of the Cu(100)/Mo system show that the probing depth in molybdenum is small, ∼1 monolayer, and that molybdenum grows layer‐by‐layer on Cu(100). Data for the Cu(100)/Fe system are also reported that suggest that iron deposition on a room‐temperature Cu(100) substrate does not initially result in simple layer‐by‐layer growth.
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