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Use of spin‐polarized electron energy‐loss spectroscopy to investigate the probing depth of low energy electrons and the morphology of thin metal films

 

作者: X. Zhang,   H. Hsu,   F. B. Dunning,   G. K. Walters,  

 

期刊: Journal of Vacuum Science&Technology A: Vacuum, Surfaces, and Films  (AIP Available online 1991)
卷期: Volume 9, issue 3  

页码: 1932-1936

 

ISSN:0734-2101

 

年代: 1991

 

DOI:10.1116/1.577547

 

出版商: American Vacuum Society

 

关键词: THIN FILMS;ELECTRON SPECTROSCOPY;MORPHOLOGY;COPPER;MOLYBDENUM;CRYSTAL FACES;IRON;DEPOSITION;PENETRATION DEPTH

 

数据来源: AIP

 

摘要:

Spin‐polarized electron energy‐loss spectroscopy has been used to investigate the probing depth of low energy (∼30 eV) electrons at metal surfaces and to study the growth and morphology of monolayer‐level metal films. Studies of the Cu(100)/Mo system show that the probing depth in molybdenum is small, ∼1 monolayer, and that molybdenum grows layer‐by‐layer on Cu(100). Data for the Cu(100)/Fe system are also reported that suggest that iron deposition on a room‐temperature Cu(100) substrate does not initially result in simple layer‐by‐layer growth.

 

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