Luminescence efficiency during ion implantation of sapphire
作者:
A. Alghamdi,
P.D. Townsend,
期刊:
Radiation Effects and Defects in Solids
(Taylor Available online 1990)
卷期:
Volume 115,
issue 1-3
页码: 73-78
ISSN:1042-0150
年代: 1990
DOI:10.1080/10420159008220555
出版商: Taylor & Francis Group
关键词: Luminescence;sapphire;defect centres;radiation damage;energy deposition
数据来源: Taylor
摘要:
Luminescence signals produced during ion implantation of sapphire are related to the F, F+and F2defect centres. However, the efficiency of light production changes with ion beam dose, the rate of energy deposition and radiation damage, hence the signals are not proportional to the defect concentrations. Data are presented which suggest that the light is primarily produced by electronic excitation. Luminescence efficiency within the region of nuclear collisions is very low. It is not possible to determine the energy dependence of the luminescence intensity, as a function of ion energy, by energy variations within a single target crystal.
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