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Tunable laboratory extended x‐ray absorption fine structure system

 

作者: G. G. Cohen,   D. A. Fischer,   J. Colbert,   N. J. Shevchik,  

 

期刊: Review of Scientific Instruments  (AIP Available online 1980)
卷期: Volume 51, issue 3  

页码: 273-277

 

ISSN:0034-6748

 

年代: 1980

 

DOI:10.1063/1.1136199

 

出版商: AIP

 

数据来源: AIP

 

摘要:

A new sensitive x‐ray monochromator and detector system for performing extended x‐ray absorption fine structure (EXAFS) measurements in the laboratory is described. The monochromator combines x‐ray focusing optics with rapid elemental tunability. The detection system effectively removes glitches from the data stream, regardless of whether they are due to impurity lines from the x‐ray source or if they are due to random instabilities in the incident beam. Used together with a high intensity rotating anode x‐ray source, this system can provide synchrotronlike photon intensities, flexibility and resolution, with the easy access and control possible only in the laboratory.

 

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