Tunable laboratory extended x‐ray absorption fine structure system
作者:
G. G. Cohen,
D. A. Fischer,
J. Colbert,
N. J. Shevchik,
期刊:
Review of Scientific Instruments
(AIP Available online 1980)
卷期:
Volume 51,
issue 3
页码: 273-277
ISSN:0034-6748
年代: 1980
DOI:10.1063/1.1136199
出版商: AIP
数据来源: AIP
摘要:
A new sensitive x‐ray monochromator and detector system for performing extended x‐ray absorption fine structure (EXAFS) measurements in the laboratory is described. The monochromator combines x‐ray focusing optics with rapid elemental tunability. The detection system effectively removes glitches from the data stream, regardless of whether they are due to impurity lines from the x‐ray source or if they are due to random instabilities in the incident beam. Used together with a high intensity rotating anode x‐ray source, this system can provide synchrotronlike photon intensities, flexibility and resolution, with the easy access and control possible only in the laboratory.
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