Atomic ordering of GaInP studied by Kelvin probe force microscopy
作者:
Y. Leng,
C. C. Williams,
L. C. Su,
G. B. Stringfellow,
期刊:
Applied Physics Letters
(AIP Available online 1995)
卷期:
Volume 66,
issue 10
页码: 1264-1266
ISSN:0003-6951
年代: 1995
DOI:10.1063/1.113257
出版商: AIP
数据来源: AIP
摘要:
The atomic ordering of GaInP has been established and studied by a variety of methods, including transmission electron microscopy, cathodoluminescence, and photoluminescence. In this work, a Kelvin probe force microscope (KPFM) has been employed to image several GaInP samples previously characterized by these established techniques. The results of our study clearly show that the KPFM is capable of distinguishing between ordered and disordered regions in GaInP, and that the KPFM contrast strongly depends on the amplitude of the applied ac bias voltage of the KPFM. The measurements indicate that ordering in GaInP modifies the density and/or lifetime of the surface states. ©1995 American Institute of Physics.
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