Titanium oxide thin films forNH3monitoring: Structural and physical characterizations
作者:
D. Manno,
G. Micocci,
R. Rella,
A. Serra,
A. Taurino,
A. Tepore,
期刊:
Journal of Applied Physics
(AIP Available online 1997)
卷期:
Volume 82,
issue 1
页码: 54-59
ISSN:0021-8979
年代: 1997
DOI:10.1063/1.365848
出版商: AIP
数据来源: AIP
摘要:
Titanium oxide thin films have been deposited by thermal evaporation in vacuum and then have been analyzed before and after a suitable thermal annealing in order to test their application inNH3gas-sensing technology. In particular, spectrophotometric and conductivity measurements have been performed in order to determine the optical and electrical properties of titanium oxide thin films. The structure and the morphology of such material have been investigated by high resolution electron microscopy and small area electron diffraction. ©1997 American Institute of Physics.
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