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Vacuum Voltage Breakdown as a Thermal Instability of the Emitting Protrusion

 

作者: Gerwig E. Vibrans,  

 

期刊: Journal of Applied Physics  (AIP Available online 1964)
卷期: Volume 35, issue 10  

页码: 2855-2857

 

ISSN:0021-8979

 

年代: 1964

 

DOI:10.1063/1.1713118

 

出版商: AIP

 

数据来源: AIP

 

摘要:

Breakdown by thermal instability of a field emitter is analyzed, taking into account the temperature dependence of field emission and of resistivity. Beyond a certain temperature the emission increases while the necessary field drops. It is shown that for a whisker‐like emitter this instability occurs when the emitting tip is only several hundred degrees centigrade hotter than the bulk of the cathode.

 

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