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Optical reading and writing on GaAs using an atomic force microscope

 

作者: G. L. Christenson,   S. A. Miller,   Z. H. Zhu,   N. C. MacDonald,   Y. H. Lo,  

 

期刊: Applied Physics Letters  （AIP Available online 1995）
卷期: Volume 66, issue 21  

页码: 2780-2782

 

ISSN:0003-6951

 

年代: 1995

 

DOI:10.1063/1.113473

 

出版商: AIP

 

数据来源: AIP

 

摘要:

Optically aided reading and writing of gold and tungsten mounds on proton‐implanted, multiple quantum well InGaAs/GaAs wafers has been demonstrated using an atomic force microscope (AFM). The system is relatively simple, requiring only a diode laser as the light source, providing a novel, compact, optoelectronic memory system. ©1995 American Institute of Physics.

 

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