Flash‐evaporated cermet films (Cr‐SiO) with 77 wt % Cr were examined by x‐ray diffraction. Bragg peaks corresponding to extremely small particles of Cr were observed. For specimens deposited onto room‐temperature Pyrex substrates, a particle size of 20 Å was calculated from the breadths of the peaks. For specimens deposited at 400°C, the Bragg peaks took on an unusual form, consisting of a central peak flanked by strong subsidiary peaks, or sidebands. These sidebands are interpreted as evidence for a strong crystal‐lographic correlation, in both separation and orientation, between chromium particles. A model consisting of short chains of touching Cr particles, with correlation only between nearest‐neighboring particles, and a particle size of 15 to 20 Å, is consistent with the observations on the 400°C specimens.